Measurement & Evaluation Test Systems for Environmental Testing Applications
Conductor Resistance Evaluation System (AMR Series)
Evaluation system makes continuous measurement of resistance changes due to solder cracking under temperature stress/shock.
Ion Migration Evaluation System (AMI Series)
Detects changes in insulation resistance on circuit boards due to humidity/moisture induced dendrites.
Electromigration Evaluation System (AEM-2000)
Evaluates electromigration under high temperatures (max. 400°C) and current stress.
Electromigration Evaluation System (AEM-1000)
Applies DC current, pulsed current, and AC pulsed current under high temperatures to measure and evaluate increasing resistance and leak current caused by electromigration.
TDDB Evaluation System
Precisely measures low-k insulation-film leak-current. Indispensable for process evaluation at temperatures as high as 350°C.
Flash Cycling Test System
Improving the pattern generator and driver allows burn-in of a variety of devices.
Latest News
From espec.com
- New benchtop humidity model
Thursday, January 21 2010
ESPEC North America expands its Criterion benchtop line to include a 4 cu. ft. temp./humidity model.
- Visit us at the Photovoltaic Technology Show 2010
Monday, December 21 2009
ESPEC will be exhibiting at the Photovoltaic Technology Show 2010 in San Francisco! Contact us for your FREE ticket today!
- NEW: Web Controller for remote access
Friday, November 20 2009
Upgrade your new or existing ESPEC SCP-220 controller with Ethernet/LAN access. Check out the new Web Controller, try the live demo, and request a quote!
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